Nanotechnology Defect Oriented Testing for Nano Metric CMOS VLSI Circuits 2007 342 7z

Nanotechnology
Defect Oriented Testing for Nano Metric CMOS VLSI Circuits 2007 342 7z

Name	Nanotechnology	DOWNLOAD Copy Link Trouble downloading? see How To
Total Size	5.9 GB
Total Files	368
Hash	BF2A67D2CB2627487069B08B414D3275E7AF3252

/Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits, 2007, p.342.7z	5.8 MB
/Radio Design in Nanometer Technologies, 2006, p.341.7z	33.3 MB
/Electrochemistry of Nanomaterials, 2001, p.321.7z	22.5 MB
/Computational Methods for Nanoscale Applications, 2008, p.543.7z	7.2 MB
/Plasmonic. Nanoguides and Circuits, 2009, p.450.7z	26.9 MB
/Chemistry of Nanostructured Materials, 2003, p.386.7z	10.1 MB
/Self-Organized Morphology in Nanostructured Materials, 2008, p.182.7z	8.2 MB
/Fundamentals of Nanoscale Film Analysis, 2007, p.349.7z	4.3 MB
/Thermoset Nanocomposites for Engineering Applications, 2007, p.346.7z	4.1 MB
/One-Dimensional Nanostructures, 2008, p.335.7z	49.6 MB
/Controlled Growth of Nanomaterials, 2007, p.479.7z	37.5 MB
/Particulate Systems in Nano- and Biotechnologies, 2009, p.426.7z	14.0 MB
/Machining with Nanomaterials, 2009, p.372.7z	9.5 MB
/Nanocrystals Forming Mesoscopic Structures, 2005, p.345.7z	9.2 MB
/Characterization of Nanophase Materials, 2000, p.420.7z	8.2 MB
Showing first 15 files of 368 total files