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Defect Oriented Testing for Nano Metric CMOS VLSI Circuits 2007 342 pdf |
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Total Size |
6.4 GB |
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Total Files |
365 |
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CE05DED73ADC815759FE28AD7455A1CD4E2985D2 |
/Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits, 2007, p.342.pdf |
6.1 MB |
/Computational Methods for Nanoscale Applications, 2008, p.543.pdf |
8.9 MB |
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24.4 MB |
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34.7 MB |
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11.7 MB |
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4.9 MB |
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29.7 MB |
/Self-Organized Morphology in Nanostructured Materials, 2008, p.182.pdf |
8.8 MB |
/Thermoset Nanocomposites for Engineering Applications, 2007, p.346.pdf |
4.5 MB |
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8.7 MB |
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39.7 MB |
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10.5 MB |
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7.6 MB |
/Nanocrystals Forming Mesoscopic Structures, 2005, p.345.pdf |
10.3 MB |
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50.8 MB |
Showing first 15 files of 365 total files |
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