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2/0 |
2.0 GB |
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5.9 GB |
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45.4 MB |
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Showing first 1 matched files of 368 total files |
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2/11 |
1.8 GB |
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2/0 |
771.6 KB |
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/Khan S. Metrology, standardization, certification...2017.pdf |
771.6 KB |
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1 matched files |
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Stolojan V. Nanometrology Using the Transmission Electron Microscope 2015 |
1/0 |
8.3 MB |
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/Stolojan V. Nanometrology Using the Transmission Electron Microscope 2015.pdf |
8.3 MB |
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1 matched files |
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10.8 GB |
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4.4 MB |
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/506 Toru Yoshizawa - Handbook of optical metrology principles and applications - 2009.pdf |
15.0 MB |
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/807 K. Harding, editor Handbook of Optical Dimensional Metrology - 2013.pdf |
16.2 MB |
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5.9 MB |
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/891 Rajpal S. Sirohi Introduction to Optical Metrology - 2015.pdf |
27.9 MB |
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Showing first 5 matched files of 1177 total files |
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10.3 GB |
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4.4 MB |
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5.9 MB |
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/506 Toru Yoshizawa - Handbook of optical metrology principles and applications - 2009.pdf |
15.0 MB |
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/807 K. Harding, editor Handbook of Optical Dimensional Metrology - 2013.pdf |
16.2 MB |
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/891 Rajpal S. Sirohi Introduction to Optical Metrology - 2015.pdf |
27.9 MB |
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Showing first 5 matched files of 1158 total files |
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48.7 MB |
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3/0 |
223.3 MB |
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/Books/Handbook of Silicon Semiconductor Metrology A Diebold Marcel Dekker 2001.pdf |
13.6 MB |
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/Covers/Handbook of Silicon Semiconductor Metrology A Diebold Marcel Dekker 2001.jpg |
55.5 KB |
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Showing first 2 matched files of 40 total files |
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1.6 GB |
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3.5 GB |
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1.6 GB |
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1.6 GB |
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3.6 GB |
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3.0 GB |
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3.4 GB |
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1.6 GB |
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Kaufmann G. Advances in Speckle Metrology and Related Tech 2011 |
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5.6 MB |
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/Kaufmann G. Advances in Speckle Metrology and Related Techniques 2011.pdf |
5.6 MB |
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1 matched files |
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3.0 GB |
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3.5 GB |
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